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Incorporation of Atmospheric Neutron Single Event Effects Analysis into a System Safety Assessment

Journal Article
2011-01-2497
ISSN: 1946-3855, e-ISSN: 1946-3901
DOI: https://doi.org/10.4271/2011-01-2497
Published October 18, 2011 by SAE International in United States
Incorporation of Atmospheric Neutron Single Event Effects Analysis into a System Safety Assessment
Sector:
Citation: Dion, M. and Dominik, L., "Incorporation of Atmospheric Neutron Single Event Effects Analysis into a System Safety Assessment," SAE Int. J. Aerosp. 4(2):619-632, 2011, https://doi.org/10.4271/2011-01-2497.
Language: English

References

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  2. O'Bryan, M. et al “Compendium of Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA,” Workshop Record, 2007 IEEE Radiation Effects Data Workshop 153
  3. JESD89A “Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices” OCTOBER 2006
  4. IEC/TS-62396-1 “Process management for avionics - Atmospheric radiation effects - Part 1; Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment,” March 2006
  5. IEC/TS-62396 Part 2 “Guidelines for single event effects testing for avionics systems Process management for avionics,” Aug. 2008
  6. IEC/TS-62396 Part 3 “Optimising system design to accommodate the single event effects (SEE) of atmospheric radiation Aug. 2008
  7. IEC/TS-62396 Part 4 “Guidelines for designing with high voltage aircraft electronics and potential single event effects,” July 2008
  8. Cellere, G. et al “Neutron-induced soft errors in advanced Flash memories,” IEDM 2008 1
  9. Hsiao, M. Y. “A Class of Optimal Minimum Odd-weight-column SEC-DED Codes” IBM Journal of Research and Development July 1970
  10. IEC/TS-62396 Part 5 “Guidelines for assessing thermal neutron fluxes and effects in avionics systems,” October 2008
  11. Architecture Design for Soft Errors” Mukherjee, Shubu Kaufmann, Morgan March 7 2008
  12. Mukherjee, S. “A Systematic Methodology to Compute the Architectural Vulnerability Factors for a High-Performance Microprocessor” Proceedings of the 36th International Symposium on Micro architecture (MICRO-36'03)

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