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Automatic Test Case Generation for Safety-Related Embedded Systems

Journal Article
2008-01-0114
ISSN: 1946-4614, e-ISSN: 1946-4622
Published April 14, 2008 by SAE International in United States
Automatic Test Case Generation for Safety-Related Embedded Systems
Sector:
Citation: Dämon, P., "Automatic Test Case Generation for Safety-Related Embedded Systems," SAE Int. J. Passeng. Cars - Electron. Electr. Syst. 1(1):18-25, 2009, https://doi.org/10.4271/2008-01-0114.
Language: English

Abstract:

Software testing for embedded systems is based on a labor-intensive manual process, which often fails to provide the required level of quality. Nevertheless, faults within software systems, especially those which are relevant for safety-related applications (e.g., Steer-by-Wire, Break-by-Wire), must be detected to prevent the occurrence of a catastrophe. Considering upcoming technologies such as X-By-Wire systems, future software for embedded systems will become more complex and a higher level of quality has to be achieved. This will lead to a significantly increased testing effort. Thus, a systematic method for automated software testing is highly desirable.