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Portable IR Emittance Measurement System for Spacecraft Thermal Design and Quality Control
Technical Paper
2007-01-3124
ISSN: 0148-7191, e-ISSN: 2688-3627
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English
Abstract
This paper reports a development of a εH measurement system. The system has been evaluated by comparing the measurement data with the data, which were obtained by conventional reliable techniques in the laboratory. From the evaluation results it was confirmed that the measurement accuracies of the present systems is Δε = ±0.05. Now this system is being improved for higher measurement accuracy, and it will be commercialized in 2007.
Authors
Citation
Ohnishi, A., Yamana, H., Tachikawa, S., Nagano, H. et al., "Portable IR Emittance Measurement System for Spacecraft Thermal Design and Quality Control," SAE Technical Paper 2007-01-3124, 2007, https://doi.org/10.4271/2007-01-3124.Also In
References
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