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Extended Qualification of Power MOSFET to Fulfill Today's Requirements of Automotive Applications
Technical Paper
2006-01-0592
ISSN: 0148-7191, e-ISSN: 2688-3627
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English
Abstract
This paper focuses on the requirements of electronic systems in automotive applications in terms of reliability and quality. As one of the most common devices in such applications for switching electronic loads, the power MOSFET, is investigated in detail. Today's qualification procedure for discrete devices according to AEC Q101 [1] will be explained and how this correlates to the stress of the device in the application. It will be pointed out what additional tests for “extended qualification” should be made to deal with critical failure modes reducing overly conservative safety margins and preventing excessive costs on the component side. The tests will be explained and the results presented.
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Citation
Pürschel, M., "Extended Qualification of Power MOSFET to Fulfill Today's Requirements of Automotive Applications," SAE Technical Paper 2006-01-0592, 2006, https://doi.org/10.4271/2006-01-0592.Also In
SAE 2006 Transactions Journal of Passenger Cars: Electronic and Electrical Systems
Number: V115-7; Published: 2007-03-30
Number: V115-7; Published: 2007-03-30
References
- Automotive Electronics Council June 29 2005 STRESS TEST QUALIFICATION FOR AUTOMOTIVE GRADE DISCRETE EMI CONDUCTOR
- http://www.weibull.com/hotwire/issue21/hottopics21.htm January 2005
- JEDEC PUBLICATION Failure Mechanisms and Models for Semiconductor Devices AUGUST 2003
- IPC Soldertec Global 3rd June 2005 Automotive MOSFET Package for Lead Free Reflow Soldering Processes