This content is not included in your SAE MOBILUS subscription, or you are not logged in.
Design of Wireless Multi-Channel Measurement System
ISSN: 0148-7191, e-ISSN: 2688-3627
Published July 11, 2005 by SAE International in United States
Annotation ability available
We are developing a wireless multi-channel measurement system in order to measure temperatures during thermal vacuum tests of spacecraft, accelerations during vibration tests, etc. As a developing measurement system, we introduce the prototype model of the wireless temperature measurement system. The temperature data are transmitted to the data logger by radio instead of thermocouple wires, thus it will be easier to prepare thermal vacuum tests, and the test system will become very simple. Details of the system configuration, its specification and performance are presented.
- Sumitaka Tachikawa - Institute of Space and Astronautical Science/Japan Aerospace Exploration Agency
- Akira Ohnishi - Institute of Space and Astronautical Science/Japan Aerospace Exploration Agency
- Hosei Nagano - Institute of Space and Astronautical Science/Japan Aerospace Exploration Agency
- Shozo Katsuki - UBE Indusutries, Ltd.
- Tsutomu Tanaka - Takion Co., Ltd.
- Yutaka Saitoh - Takion Co., Ltd.
CitationTachikawa, S., Ohnishi, A., Nagano, H., Katsuki, S. et al., "Design of Wireless Multi-Channel Measurement System," SAE Technical Paper 2005-01-3027, 2005, https://doi.org/10.4271/2005-01-3027.
- Robert, D. Karman “Chapter 7 Thermal Verification Tests,” Satellite Thermal Control for Systems Engineers AIAA 243 258
- Data Sheet PIC16F87X, 28/40-Pin 8-bit CMOS FLASH Microcontrollers Microchip Technology Inc.
- Data Sheet DS18B20, Programmable Resolution 1-Wire Digital Thermometer, Dallas Semiconductor
- Application Note 187, 1-Wire Search Algorithm, Dallas Semiconductor
- Application Note 2420, 1-Wire Communication with a Microchip PICmicro Microcontroller, Dallas Semiconductor
- Application Note 208, Curve Fitting the Error of Bandgap-Based Digital Temperature Sensor, Dallas Semiconductor