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A Comparative Study of Bayesian-Based Reliability Prediction Methodologies
Technical Paper
2005-01-1777
ISSN: 0148-7191, e-ISSN: 2688-3627
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English
Abstract
As new technology is introduced into automotive engineering, the level of uncertainty regarding system robustness increases. With it reliability assessment tools that account for such uncertainty is expected to gain increased attention. This can naturally lead to Bayesian-based tools. This paper examines three reliability assessment methodologies that operate in the Bayesian framework. Two of them are geared towards electronic parts and assemblies, with the remaining one being geared towards systems in general. In doing so, they were critiqued in terms of four dimensions: (1) basic architecture, (2) input factors, (3) handling of qualitative data, and (4) failure rate updating mechanisms.
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Citation
Itabashi-Campbell, R., Goel, P., and Yadav, O., "A Comparative Study of Bayesian-Based Reliability Prediction Methodologies," SAE Technical Paper 2005-01-1777, 2005, https://doi.org/10.4271/2005-01-1777.Also In
References
- Goel, Parveen S. Itabashi-Campbell Rachel “Analytical Approach to Meeting Reliability and Confidence Requirements of Automotive Steering Systems.” 2004 SAE World Congress Technical Program. Cobo Hall, Detroit 08 March 2004
- Murphy, Kevin “A brief introduction to Bayes’ Rule.” http://www.ai.mit.edu/~murphyk/Bayes/bayesrule.html
- Priore, Mary G. Goel Parveen S. Rachel R. Itabashi-Campbell “TRW Automotive Assesses PRISM Methodology for Internal Use.” The Journal of the Reliability Analysis Center 2002 14 19 http://rac.alionscience.com/pdf/1q2002.pdf
- Reliability Analysis Center Introduction to Software Reliability: A State of the Art Review Rome, New York 1996
- Telcordia Technologies Reliability Prediction Procedure for Electronic Equipment 1 May 2001
- Tobias, Paul A. Trindale. David C. Applied Reliability 2nd ed New York Van Nostrand Reinhold 1995
- Yadav, Om Prakash “An Integrated Framework for Reliability Prediction during Product Development Process,” Wayne State University Detroit, Michigan 2002
- Yadav, Om Prakash Singh Nanua Goel Parveen S. Itabashi-Campbell Rachel R. “A Framework for Reliability Prediction during Product Development Process Incorporating Engineering Judgments.” Quality Engineering 15.4 2003 649 662