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Identification of Integrated Circuits Conducted Emission Limits for Automotive Applications
Technical Paper
2005-01-0634
ISSN: 0148-7191, e-ISSN: 2688-3627
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English
Abstract
This paper describes an experimental technique to relate IC conduced emission, as measured by the 1 method (IEC 61967-4), and conducted emission measured by the ground plane method, as described in the CISPR 25 standard. In particular, the maximum limit of IC power supply current spectrum is derived on the basis of emission limits specified in the CISPR 25 document. Such information is useful when defining EMC specifications at IC level.
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Authors
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Citation
Musolino, F., Fiori, F., Schinco, F., and De La Pierre, P., "Identification of Integrated Circuits Conducted Emission Limits for Automotive Applications," SAE Technical Paper 2005-01-0634, 2005, https://doi.org/10.4271/2005-01-0634.Also In
References
- Integrated circuits, measurements of electromagnetic emission in the range 150 kHz - 1GHz 2004
- Electromagnetic compatibility measurement procedures for integrated circuits - integrated circuit radiated emissions measurement procedures SAE J1752 Jan. 2003
- CISPR 25 Ed.2.0: Radio disturbance characteristics for the protection of receivers used on board vehicles, boats and on devices - Limits and methods of measurements, 150 kHz to 1000MHz Aug. 2003
- Limits and method of measurements of radio disturbance characteristics of components and modules for the protection of receivers used on-board vehicles SAE J1113/41 May 2000