The Effect of Substrate Emissivity on the Spectral Emission of a Hot-Gas Overlayer

Recently, in operando optical investigations of high temperature solid oxide electrochemical cells (SOECs) have gained significant traction with several research groups motivated by a need to directly correlate electrochemical performances of SOECs with their associated and complex electrode processes. These techniques (including Raman spectroscopy, ambient x-ray photoelectron spectroscopy, near-infrared thermal imaging, and Fourier transform infrared emission spectroscopy) have demonstrated a significant advantage over traditional, indirect experimental methods by providing direct, non-invasive information in real time along with high temporal, spatial, and/or molecular resolution.