Corrosion Failures in Semiconductor Devices and Electronic Systems

831830

12/05/1983

Event
SAE Automotive Corrosion and Prevention Conference and Exposition
Authors Abstract
Content
The automotive environment with its wide range of temperatures and corrosive liquids and gases provides a harsh environment for electronic systems. This situation is further compounded by the fact that these systems are composed of a wide variety of dissimilar materials. It should be no surprise, therefore, that corrosion can be a significant problem in electronic systems.
This paper will discuss corrosion problems related to the following: open circuits in connector contacts, leakage and shorts on printed circuit boards, metal migration problems, and corrosion problems in plastic encapsulated semiconductor devices.
In many of these corrosion situations, the initial mechanism involved in the corrosion process will often cause an electronic system to malfunction. It is, therefore, of utmost importance that these corrosion mechanisms be carefully evaluated during the development of electronic systems so that necessary steps can be taken to prevent their occurrence.
Meta TagsDetails
DOI
https://doi.org/10.4271/831830
Pages
11
Citation
Cook, J., and Servais, G., "Corrosion Failures in Semiconductor Devices and Electronic Systems," SAE Technical Paper 831830, 1983, https://doi.org/10.4271/831830.
Additional Details
Publisher
Published
Dec 5, 1983
Product Code
831830
Content Type
Technical Paper
Language
English