This content is not included in
your SAE MOBILUS subscription, or you are not logged in.
Micro Deformation Measurement Using Temporal Phase-Shifting and Spatial-Carrier Digital Speckle Pattern Interferometry
Technical Paper
2016-01-0415
ISSN: 0148-7191, e-ISSN: 2688-3627
Annotation ability available
Sector:
Language:
English
Abstract
Temporal phase-shifting and spatial-carrier techniques are the two dominant phase extraction methods used in digital speckle pattern interferometry (DSPI). Temporal phase-shifting technique enjoys the advantages of precise phase extraction and capability of high-quality phase map formation, but suffers from the limitation in its use in dynamic measurement due to the time cost for carrying out the phase shift. To meet the rising demand of dynamic measurement of deformations in modern industry, spatial-carrier technique is developed to extract the phase information from a single speckle interferogram, yielding less time cost during a test. In this paper, both temporal phase-shifting and spatial-carrier techniques are investigated in theory as well as experiment. The experiment results from measuring a same deformation behavior using both techniques are used to compare the performances of the two phase extraction techniques. The results support the conclusion that the DSPI with the spatial-carrier technique can also be used to measure deformations precisely, although its phase maps are of less quality in comparison to those obtained by the DSPI with the temporal phase-shifting technique.
Recommended Content
| Technical Paper | Recent Advances in the Development of Spacesuit Gloves |
| Ground Vehicle Standard | Motor Vehicle License Plates |
| Journal Article | Fatigue Assessment of Nodular Cast Iron with Material Imperfections |
Authors
- Sijin Wu - Beijing Information Science and Technology University
- Xinya Gao - Hefei University of Technology
- Yong Lv - Beijing Information Science and Technology University
- Yanpeng Jiang - Beijing Information Science and Technology University
- Yao Fang - Beijing Information Science and Technology University
- Aiguo Zhou - Tongji University
Citation
Wu, S., Gao, X., Lv, Y., Jiang, Y. et al., "Micro Deformation Measurement Using Temporal Phase-Shifting and Spatial-Carrier Digital Speckle Pattern Interferometry," SAE Technical Paper 2016-01-0415, 2016, https://doi.org/10.4271/2016-01-0415.Also In
References
- Butters , J. N. and Leendertz , J. A. Speckle Pattern and Holographic Techniques in Engineering Metrology Opt. Laser Techn., 3 1 26 30 1971 10.1016/S0030-3992(71)80007-5
- Stetson , K. A. and Brohinsky , W. R. Electrooptic Holography and Its Application to Hologram Interferometry Appl. Opt., 24 21 3631 3637 1985 10.1364/AO.24.003631
- Rastogi , P. K. Digital Speckle Pattern Interferometry and Related Techniques Rastogi , P. K. 384 2000 9780471490524
- Creath , K. Temporal Phase-shifting Speckle Interferometry 29th Annual Technical Symposium, International Society for Optics and Photonics 337 346 1985, November
- Wu , S. , Zhu , L. , Feng , Q. , and Yang , L. Digital Shearography with in Situ Phase Shift Calibration Opt. Laser Eng., 50 9 1260 1266 2012 10.1016/j.optlaseng.2012.03.011
- Saldner , H. O. , Molin , N. E. , and Stetson , K. A. Fouriertransform Evaluation of Phase Data in Spatially Phase-biased TV Holograms Appl. Opt., 35 2 332 336 1996 10.1364/AO.35.000332
- Xie , X. , Xu , N. , Sun , J. , Wang , Y. et al. Simultaneous Measurement of Deformation and the First Derivative with Spatial Phase-shift Digital Shearography Opt. Commun., 286 277 281 2012 10.1016/j.optcom.2012.08.072
- Zhu , L. , Wang , Y. , Xu , N. , Wu , S. et al. Real-time Monitoring of Phase Maps of Digital Shearography Opt. Eng., 52 10 101902 2013 10.1117/1.OE.52.10.101902
- Yang , L. , Zhu , L. , Xie , X. , Dong , M. et al. New Development of Phase Shift Techniques in Measurement by Electronic Speckle Pattern Interferometry (ESPI) Journal of Beijing Information Science and Technology University, 28 2 1 8 2013
- Yang , L. , Xie , X. , Zhu , L. , Wu , S. et al. Review of Electronic Speckle Pattern Interferometry (ESPI) for Three Dimensional Displacement Measurement Chinese J. Mech. Eng., 27 1 1 13 2014 10.3901/CJME.2014.01.001
- Pedrini , G. , Osten , W. , and Gusev , M. E. High-speed Digital Holographic Interferometry for Vibration Measurement Appl. Opt., 45 15 3456 3462 2006 10.1364/AO.45.003456
- Liu , K. , Wu , S. , Gao , X. , and Yang , L. Simultaneous Measurement of In-plane and Out-of-plane Deformations using Dual-beam Spatial-carrier Digital Speckle Pattern Interferometry Appl. Mech. Mater., 782 316 325 2015 10.4028/www.scientific.net/AMM.782.316
- Burke , J. and Helmers , H. Spatial Versus Temporal Phase Shifting in Electronic Speckle-pattern Interferometry: Noise Comparison in Phase Maps Appl. Opt., 39 25 4598 4606 2000 10.1364/AO.39.004598
- Xie , X. , Yang , L. , Chen , X. , Xu , N. et al. Review and Comparison of Temporal- and Spatial-phase Shift Speckle Pattern Interferometry for 3D Deformation Measurement Proc. SPIE 8916 2013 10.1117/12.2036603
- Su , X. and Chen , W. Reliability-guided Phase Unwrapping Algorithm: a Review Opt. Laser Eng., 42 3 245 261 2004 10.1016/j.optlaseng.2003.11.002
- Bhaduri , B. , Mohan , N. K. , Kothiyal , M. P. , and Sirohi , R. S. Use of Spatial Phase Shifting Technique in Digital Speckle Pattern Interferometry (DSPI) and Digital Shearography (DS) Opt. Express, 14 24 11598 11607 2006 10.1364/OE.14.011598
- Fu , Y. , Pedrini , G. , and Osten , W. Vibration Measurement by Temporal Fourier Analyses of a Digital Hologram Sequence Appl. Opt., 46 23 5719 5727 2007 10.1364/AO.46.005719