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Understanding Short Circuit Events and Power Semiconductors
Technical Paper
2015-01-0269
ISSN: 0148-7191, e-ISSN: 2688-3627
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English
Abstract
This paper will describe different types of short circuit conditions, how they affect power semiconductor devices, and how to detect and safely mitigate the event.
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Citation
Kiep, A., Puerschel, M., and Spielman, C., "Understanding Short Circuit Events and Power Semiconductors," SAE Technical Paper 2015-01-0269, 2015, https://doi.org/10.4271/2015-01-0269.Also In
References
- IEC/TR 62380 Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment IEC Technical Report, Rev. August 2004
- AEC Q101-006 Attachment 6 (= AEC-Q-100-012 Attachment 12) Short Circuit Reliability Characterization of SMART Power Devices for 12V Systems September 14 2006
- Kiep , A. and Puerschel , M. Spontaneous Transistor Failures in Automotive Power Electronics SAE Technical Paper 2014-01-0228 2014 10.4271/2014-01-0228