SEM Imaging at Multiple Voltages of Friction Films

2013-01-1220

04/08/2013

Event
SAE 2013 World Congress & Exhibition
Authors Abstract
Content
This work proposes to acquire images with multiple electron beam energies in the scanning electron microscope to get more information on the lateral distribution of the carbonaceous layer on the surface of friction films formed in brake couples, by combining the backscattered electron images with the behavior of the intensities of the major characteristic X-ray lines as a function of electron beam energy.
Meta TagsDetails
DOI
https://doi.org/10.4271/2013-01-1220
Pages
5
Citation
Vasconcellos, M., and Hinrichs, R., "SEM Imaging at Multiple Voltages of Friction Films," SAE Technical Paper 2013-01-1220, 2013, https://doi.org/10.4271/2013-01-1220.
Additional Details
Publisher
Published
Apr 8, 2013
Product Code
2013-01-1220
Content Type
Technical Paper
Language
English